Finite element approximations for electrical impedance tomography

报告题目: Finite element approximations for electrical impedance tomography

报告人: 金邦梯

报告时间： 2019年2月23日下午2:00-3:00

报告地点： 工商楼200-9

报告摘要: Electrical impedance tomography is a noninvasive medical imaging modality, which aims at recovering the conductivity from the boundary electrode voltage measurements. Most reconstruction techniques employ Tikhonov regularization with different penalties, and then discretize the optimization by means of finite element methods. In this talk, I will describe finite element approximations on both uniform and adaptive meshes, and discuss their convergence properties. I will illustrate the discussions with numerical experiments.

报告人简介: Dr. Bangti Jin received Ph.D. degree in applied mathematics from the Chinese University of Hong Kong, Hong Kong, in 2008. Previously, he was an assistant Professor of mathematics at University of California, Riverside (2013-2014), a visiting assistant professor at Texas A&M University (2010-2013), an Alexandre von Humboldt Postdoctoral Researcher at the University of Bremen (2009-2010). He is currently a Reader in inverse problems in the Department of Computer Science, University College London, London, U.K. His research interests include computational inverse problems and numerical analysis of differential equations.

联系人：胡贤良(xlhu@zju.edu.cn)